Altimet is considered as the specialist in Surface Metrology, with prestigious International References.
Altimet as manufacturer, ensures the development, assembly, sales and maintenance of its range of instruments.
SURFACE METROLOGY
During the end of the 20th century, the study of surfaces has improved. Many areas of industrial activity are directly affected by surface metrology. The phenomena of friction, wear & tear (…) occur at the solid surface and the surface metrology play at this moment a main role in the control of mechanics components, as well as optical and electronical components.
Coming from the well-known concept of roughness in Mechanics, the deep study of “Valleys and Peaks” of the surface allows scientists and engineers to develop quality diagnostics, to functionality, aesthetics of their product or their material with a new metrological approach.
This includes new surface roughness parameters currently set up via the work of standards committees the new 3D measurement norm ISO 25 178 within the ISO International.
Our embedded machine has found its applications in engraving measurement,texturing, polished or micro-structured surface states especially in watchmaking industries, fiduciary and laser engraving.
With the measurement mobility in workshop environment, sometimes 6 meters height in the line, with centering rollers cured to 200 ° C.
It is also compatible with many lining for an easier use.
Specifications
AXIS
Length X, Y, Z (mm): 50 × 50 × 50
Motorized Axis DC
Max Speed.: up to 30 mm/s
NON-CONTACT CONFOCAL SENSOR
Measuring range from 100 µm to 25 mm
Resolution up to 5 nm
Acquisition Rate up to 4kHz
Camera definition of the measurement area
MODULAR ARCHITECTURE
(For high reliability)
Rolling Rack
operates on battery or outlet
Remote control
Possible integration on a marble
ALTISURF 500
Best-seller of the Altisurf range, this metrology station integrates the latest technology of point or line sensor, with or without contact.
Thanks to its versatility, this instrument will meet most of your measurement needs laboratory either by the diversity of materials to be analyzed (metals, glass, textile…) or controls carried out (roughness, shape, dimensional).
Our modular architecture and the several options available allow us to offer a turnkey solution for automated control in production.
Contact: mechanical probe, µ-force (resolution up to 7.5nm)
Non-Contact: chromatic confocal, interferometry, triangulated laser (resolution up to 0.5Nm)
ALTISURF 520
With its larger dimensions and its gantry structure, the Altisurf 520 is perfect for the measurement and analysis of your large parts.
Its large measurement volume also offers the option of integrating complex fixturing (double rotary axis) or palletization of the samples for the production.
Specifications
AXIS
Length X, Y , Z (mm): 200 × 200 × 200
Motorized DC Axis
Flatness below 2 µm over 200mm after correction
Max speed. : up to 40 mm/s
Option: Stepping 0,1 µm
Option: double rotary axis
SENSORS
Multi-sensor architecture: multiple sensors can be embedded on the same station and used together.
Contact: Inductive probe with diamond tip, µ-force (resolution up to 7.5nm)
Non-Contact: chromatic confocal, interferometry, triangulated laser (resolution up to 0.5Nm)
ALTISURF 530
Primarily Developed for semiconductor applications, the Altisurf 530 is also the basis for many metrology stations adapted to very specific customer needs.
Such as the Altisurf 500 and 520, it can integrate all kind of sensor and fixturing.
Specifications
AXIS
Length x, y, z (mm): 300x300x300
Motorized DC Axis
Flatness less than 2µm of 300mm after correction
Max Speed. : up to 40 mm/s
Option: Stepping 0,1 µm
Option: double rotary axis
SENSORS
Wide range of embeddable sensors
Contact: Inductive probe with diamond tip , µ-force
The Altisurf 560 enables you to study the relationship between the states of surfaces and performance / qualities expected (Functionality, aspect, aging, wear, porosity, adherence.)